The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2003
Filed:
Aug. 10, 2000
Alfred Johann Peter Haszler, Valendar, DE;
Hormoz Ghaziary, Los Gatos, CA (US);
Corus Aluminium Walzprodukte GmbH, Koblenz, DE;
Abstract
A device for the measurement of the thickness of a first layer, including one or more sublayers, on a second layer of a metal sheet by X-ray fluorescence analysis, includes (a) an X-ray source for generating and directing a beam of polychromatic primary X-rays, the beam being able to penetrate into the first and second layers for converting primary X-rays into chemical element specific fluorescent X-rays by absorption of primary X-rays and re-emission of fluorescent X-rays by the chemical element; and (b) a detector module for detecting element specific fluorescent X-rays and determining an intensity thereof. In the method of using the device, the detector module for detection is placed at an angle with respect to the primary beam of X-rays in dependence of the chemical element from which the fluorescent X-rays are to be detected. The device achieves an improvement in the efficiency of detection, and the measurement time is reduced accordingly. Hence, a device is provided with which alloys with a low concentration of fluorescent elements can now be analyzed, for determining the thickness of a cladding.