Hokei Lam

Title: Hokei Lam: Innovator in Magnetic Head Testing Technologies

Introduction

Hokei Lam is a prominent inventor based in Hong Kong, CN. He has made significant contributions to the field of magnetic head testing, holding a total of 5 patents. His innovative approaches have enhanced the reliability and performance of magnetic heads used in various applications.

Latest Patents

Hokei Lam's latest patents include a method of testing anti-high temperature performance of a magnetic head and an apparatus thereof. This method involves applying multiple second magnetic fields with varying intensities in a second direction to the magnetic head. It measures a second output parameter curve to determine if any variations exceed allowable values. This invention allows for the identification of defective magnetic heads without the need for heating them. Another notable patent is a testing method of a magnetic head, which includes applying a first magnetic field with constant intensity in a first direction, while simultaneously applying a second magnetic field with variable intensities. This method measures noise changes to screen out defective magnetic heads with poor noise characteristics and unstable performance.

Career Highlights

Hokei Lam is currently employed at Sae Magnetics (H.K.) Limited, where he continues to develop innovative solutions in magnetic technology. His work has been instrumental in advancing the testing methodologies for magnetic heads, ensuring higher quality and performance standards in the industry.

Collaborations

Hokei Lam has collaborated with notable colleagues, including Juren Ding and Rongkwang Ni. Their combined expertise has contributed to the successful development of advanced testing techniques in the field.

Conclusion

Hokei Lam's contributions to magnetic head testing technologies demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the challenges in the industry and provide effective solutions to enhance performance.