The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2016
Filed:
Jun. 21, 2013
Sae Magnetics (H.k.) Ltd., Hong Kong, CN;
Hokei Lam, Hong Kong, CN;
Mankit Lee, Hong Kong, CN;
Cheukman Lui, Hong Kong, CN;
Wahchun Chan, Hong Kong, CN;
Juren Ding, Hong Kong, CN;
Rongkwang Ni, Hong Kong, CN;
Cheukwing Leung, Hong Kong, CN;
Wanyin Kwan, Hong Kong, CN;
SAE MAGNETICS (H.K.) LTD., Hong Kong, CN;
Abstract
A testing method of a magnetic head includes: applying a first magnetic field with a constant intensity in a first direction that is the same with that of the longitudinal bias field to the magnetic head, simultaneously applying a second magnetic field with variant intensities in a second direction traversing the air bearing surface, and measuring a first noise; applying a third magnetic field with a constant intensity in a third direction that is opposite to the first direction to the magnetic head, simultaneously applying the second magnetic field with variant intensities in the second direction, and measuring a second noise; and analyzing noise change between the first noise and the second noise. The invention can screen out defective magnetic heads that possess poor noise characteristic and unstable performance.