The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2015
Filed:
Apr. 29, 2011
Chiuming Lueng, Hong Kong, CN;
Cheukman Lui, Hong Kong, CN;
Mankit Lee, Hong Kong, CN;
Hokei Lam, Hong Kong, CN;
Kwokkam Leung, Hong Kong, CN;
Cheukwing Leung, Hong Kong, CN;
Juren Ding, Hong Kong, CN;
Rongkwang NI, Hong Kong, CN;
Chiuming Lueng, Hong Kong, CN;
Cheukman Lui, Hong Kong, CN;
Mankit Lee, Hong Kong, CN;
Hokei Lam, Hong Kong, CN;
Kwokkam Leung, Hong Kong, CN;
Cheukwing Leung, Hong Kong, CN;
Juren Ding, Hong Kong, CN;
Rongkwang Ni, Hong Kong, CN;
SAE MAGNETICS (H.K.) LTD., Hong Kong, CN;
Abstract
A method of testing anti-high temperature performance of a magnetic head comprises applying a second magnetic field with different intensities in a second direction and the changing first magnetic fields in a first direction, and measuring a plurality of second output parameter curves; and judging whether a variation that is beyond an allowable value is presented on the second output parameter curves, thereby screening out a defective magnetic head, therein the first direction is perpendicular to the air bearing surface of the magnetic head, and the second direction is perpendicular to the shielding layers of the magnetic head. The present invention can screen out defective magnetic heads that possess poor anti-high temperature performance without heating the magnetic head and with high precision.