The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Apr. 29, 2011
Cheukman Lui, Hong Kong, CN;
Chiuming Lueng, Hong Kong, CN;
Hokei Lam, Hong Kong, CN;
Mankit Lee, Hong Kong, CN;
Kwokkam Leung, Hong Kong, CN;
Cheukwing Leung, Hong Kong, CN;
Juren Ding, Hong Kong, CN;
Rongkwang NI, Hong Kong, CN;
Cheukman Lui, Hong Kong, CN;
Chiuming Lueng, Hong Kong, CN;
Hokei Lam, Hong Kong, CN;
Mankit Lee, Hong Kong, CN;
Kwokkam Leung, Hong Kong, CN;
Cheukwing Leung, Hong Kong, CN;
Juren Ding, Hong Kong, CN;
Rongkwang Ni, Hong Kong, CN;
SAE Magnetics (H.K.) Ltd., Hong Kong, CN;
Abstract
A method of testing anti-high temperature performance of a magnetic head comprises applying a plurality of second magnetic fields with different intensities in a second direction to the magnetic head, and measuring a second output parameter curve, and judging whether a variation that is beyond an allowable value is presented on the second output parameter curve, therein the second direction passes through the ABS and at an angle whose absolute value is an acute angle to the ABS. The present invention can screen out defective magnetic heads that possess poor anti-high temperature performance without heating the magnetic head.