Hiroyuki Tanizaki

Title: Hiroyuki Tanizaki: Innovator in Inspection Technology

Introduction

Hiroyuki Tanizaki is a notable inventor based in Mie, Japan. He has made significant contributions to the field of inspection technology, particularly in methods for evaluating line width and positional errors in patterns. With a total of 4 patents to his name, Tanizaki's work has had a considerable impact on the industry.

Latest Patents

Tanizaki's latest patents include an innovative inspection system and method for inspecting line width and/or positional errors of a pattern. This method involves imaging an object to be inspected and obtaining an optical image. It includes creating a reference image from design pattern data, preparing an inspection recipe with necessary templates and parameter settings, and checking the pattern against the template. The process also involves detecting edges in both the reference and optical images and determining an inspection value by comparing the line widths.

Career Highlights

Throughout his career, Tanizaki has worked with prominent companies such as Toshiba Corporation and Nuflare Technology, Inc. His experience in these organizations has allowed him to refine his skills and contribute to advancements in inspection technology.

Collaborations

Tanizaki has collaborated with notable colleagues, including Hiroyuki Ikeda and Hiromu Inoue. These partnerships have fostered innovation and development in their respective fields.

Conclusion

Hiroyuki Tanizaki's contributions to inspection technology through his patents and collaborations highlight his role as a significant inventor in the industry. His work continues to influence advancements in the field.