Kanuma, Japan

Hiroyuki Fujihira



Average Co-Inventor Count = 2.2

ph-index = 2

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 2002-2005

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4 patents (USPTO):Explore Patents

Title: Innovations of Hiroyuki Fujihira

Introduction

Hiroyuki Fujihira is a notable inventor based in Kanuma, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of four patents. His work primarily focuses on enhancing the performance and reliability of semiconductor connections.

Latest Patents

Fujihira's latest patents include a chip-on-glass (COG) assembly that utilizes a layer of connecting material for bonding semiconductor chips to substrate glass circuit boards. This innovative design reduces stress concentration at the boundaries between the binder layer and both the chip and the glass board. It allows for less deformation, such as warping, even when using thinner substrate glass boards. The connecting material consists of an adhesive component containing a thermosetting resin and electroconductive particles, achieving a tensile elongation percentage of at least 5% after curing. Another significant patent involves a connection structure for semiconductor electrode terminals, which employs an anisotropically electroconductive adhesive to connect electrodes formed on an overcoat layer to other electrode terminals.

Career Highlights

Fujihira is currently associated with Sony Chemicals Corporation, where he continues to innovate in the semiconductor field. His work has been instrumental in advancing technologies that improve the efficiency and effectiveness of electronic devices.

Collaborations

Fujihira has collaborated with notable colleagues, including Motohide Takeichi and Yukio Yamada, contributing to various projects that enhance semiconductor technology.

Conclusion

Hiroyuki Fujihira's contributions to semiconductor technology through his innovative patents have significantly impacted the industry. His work continues to pave the way for advancements in electronic device performance and reliability.

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