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1 out of 63 Years Active: 2007-2011
Title: The Innovative Contributions of Hiroshi Yoshihara
Introduction
Hiroshi Yoshihara is a notable inventor based in Round Rock, Texas, with a significant portfolio of six patents. His work primarily focuses on advancements in memory technology, particularly in testing and screening methods for memory arrays.
Latest Patents
Yoshihara's latest patents include a "Method and apparatus for testing a circuit," which outlines a system for testing memory arrays. This method involves establishing a stored data vector, applying logical operations to generate original data vectors, and comparing these vectors to determine the performance of the memory array. Another significant patent is the "Method and apparatus for screening bit line of a static random access memory (SRAM) for excessive leakage current." This invention provides a method for testing SRAM cells, ensuring that the voltage levels are maintained correctly to prevent excessive leakage.
Career Highlights
Throughout his career, Hiroshi Yoshihara has worked with prominent companies such as Sony Computer Entertainment Inc. and IBM. His experience in these organizations has contributed to his expertise in the field of memory technology and circuit testing.
Collaborations
Yoshihara has collaborated with notable colleagues, including Yoichi Nishino and Sang Hoo Dhong, which has further enriched his innovative contributions to the industry.
Conclusion
Hiroshi Yoshihara's work exemplifies the spirit of innovation in the field of memory technology. His patents reflect a commitment to enhancing the efficiency and reliability of memory systems.