The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2011

Filed:

Jun. 06, 2007
Applicant:

Hiroshi Yoshihara, Round Rock, TX (US);

Inventor:

Hiroshi Yoshihara, Round Rock, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for testing a memory array are disclosed which may include establishing a stored data vector, including a plurality of data bits, within at least one circuit; applying one or more logical operations on the stored data vector to generate a succession of original data vectors at the at least one circuit; transmitting the succession of original data vectors through a memory array to provide a succession of exercised data vectors; comparing the succession of exercised data vectors to the succession of respective original data vectors; and determining whether the memory array passes or fails based on the comparing step.


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