Naka, Japan

Hirofumi Sato

This inventor holds 7 USPTO granted patents. Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Technologies Corpoartion. Active years: 2006-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hirofumi Sato. Retrieved from https://idiyas.com/inventor/hirofumi-sato-au2w8ntp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 85.7

Average Co-Inventor Count = 4.7

ph-index = 6

Forward Citations = 61(Granted Patents)


Location History:

  • Naka, JP (2006 - 2009)
  • Hitachinaka, JP (2014)

Company Filing History:


Years Active: 2006-2014

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7 patents (USPTO):Explore Patents

Title: Hirofumi Sato: Innovator in Electron Microscopy

Introduction

Hirofumi Sato is a notable inventor based in Naka, Japan. He has made significant contributions to the field of electron microscopy, holding a total of 7 patents. His work has been instrumental in advancing technology in this specialized area.

Latest Patents

One of Hirofumi Sato's latest patents includes a portion of a cover for an electron microscope. This innovation showcases his commitment to enhancing the functionality and efficiency of electron microscopy equipment.

Career Highlights

Throughout his career, Hirofumi Sato has worked with prominent companies, including Hitachi High-Technologies Corporation. His experience in these organizations has allowed him to develop and refine his inventions, contributing to the advancement of technology in his field.

Collaborations

Hirofumi has collaborated with talented individuals such as Eiichi Hazaki and Takashi Furukawa. These partnerships have fostered innovation and creativity in his projects.

Conclusion

Hirofumi Sato is a distinguished inventor whose work in electron microscopy has led to several patents and collaborations. His contributions continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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