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For the Inventor, By the Inventor

Yokohama, Japan

Hiroaki Shishido

This inventor holds 17 USPTO granted patents, primarily in Defect Inspection Technology. Top assignee: Hitachi, Ltd.. Active years: 1990-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroaki Shishido. Retrieved from https://idiyas.com/inventor/hiroaki-shishido-rtgjn2tp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 17

% Patents Active = 64.7

Average Co-Inventor Count = 3.9

ph-index = 10

Forward Citations = 425(Granted Patents)


Company Filing History:

goldMedal17 out of 42,740 
 
Hitachi, Ltd.
 patents

Years Active: 1990-2013

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Areas of Expertise:
Defect Detection
Pattern Inspection
Reticle Inspection
Foreign Particle Analysis
Abnormal Pattern Detection
Inspection Apparatus
Equipment for Detection
Method of Inspection
17 patents (USPTO):Explore Patents
1. 8553214 - Method and equipment for detecting pattern defect (2013-10-08),
2. 7791725 - Method and equipment for detecting pattern defect (2010-09-07),
3. 7456963 - Method and equipment for detecting pattern defect (2008-11-25),
4. 7251024 - Defect inspection method and apparatus therefor (2007-07-31),
5. 7132669 - Method and equipment for detecting pattern defect (2006-11-07),
6. 6921905 - Method and equipment for detecting pattern defect (2005-07-26),
7. 6819416 - Defect inspection method and apparatus therefor (2004-11-16),
8. 6800859 - Method and equipment for detecting pattern defect (2004-10-05),
9. 6621571 - Method and apparatus for inspecting defects in a patterned specimen (2003-09-16),
10. 6556290 - Defect inspection method and apparatus therefor (2003-04-29),
11. 6084664 - Method of and apparatus for inspecting reticle for defects (2000-07-04),
12. 6064477 - Method of and apparatus for inspecting reticle for defects (2000-05-16),
13. 5539514 - Foreign particle inspection apparatus and method with front and back (1996-07-23),
14. 5410400 - Foreign particle inspection apparatus (1995-04-25),
15. 5098191 - Method of inspecting reticles and apparatus therefor (1992-03-24),

Title: Hiroaki Shishido: Pioneering Inventor from Yokohama

Introduction: Hiroaki Shishido is a renowned inventor hailing from Yokohama, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Hiroaki Shishido holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his continuous commitment to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Hiroaki Shishido has worked with leading tech companies and research institutions, playing a key role in developing cutting-edge solutions that have revolutionized various industries.

Collaborations: Throughout his career, Hiroaki Shishido has collaborated with top engineers, scientists, and researchers from around the world, fostering a culture of innovation and knowledge exchange that has led to the creation of impactful inventions.

Conclusion: Hiroaki Shishido's passion for innovation and his relentless pursuit of excellence have solidified his position as a trailblazer in the world of technology, inspiring future generations of inventors to push the boundaries of what is possible.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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