Hideyuki Ohtake

Title: The Innovations of Hideyuki Ohtake

Introduction

Hideyuki Ohtake is a prominent inventor based in Kariya, Japan. He has made significant contributions to the field of film thickness measurement and inspection technologies. With a total of 9 patents to his name, Ohtake's work has advanced the capabilities of terahertz wave applications in various industries.

Latest Patents

Ohtake's latest patents include a film thickness measuring device and a film thickness measuring method. The film thickness measuring device features a terahertz wave generator, a prism with an entrance surface, an abutment surface, and an emission surface. It also includes a terahertz wave detector that captures both S-polarization and P-polarization components of a reflected wave from the sample. The control section of the device determines the thickness of the first film based on the differences in time waveforms of the reflected waves. Another notable patent is the coating film inspection apparatus, which comprises a terahertz-wave generator, an irradiation optical system, and a terahertz-wave detector. This apparatus detects the electric field intensity of the terahertz-wave and calculates film thickness based on the time difference between detected peaks.

Career Highlights

Throughout his career, Hideyuki Ohtake has worked with notable companies such as Aisin Seiki and Toyota Motor Corporation. His experience in these organizations has allowed him to develop and refine his innovative technologies.

Collaborations

Ohtake has collaborated with talented individuals in his field, including Koichiro Tanaka and Masaya Nagai. These partnerships have contributed to the success of his inventions and advancements in technology.

Conclusion

Hideyuki Ohtake's contributions to film thickness measurement and inspection technologies have made a significant impact in his field. His innovative patents and collaborations with industry leaders highlight his dedication to advancing technology.