The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2007
Filed:
Aug. 26, 2004
Hideyuki Ohtake, Kariya, JP;
Koichiro Tanaka, Kyoto, JP;
Masaya Nagai, Kyoto, JP;
Junpei Yamashita, Kyoto, JP;
Kumiko Yamashita, Hyogo, JP;
Hideyuki Ohtake, Kariya, JP;
Koichiro Tanaka, Kyoto, JP;
Masaya Nagai, Kyoto, JP;
Junpei Yamashita, Kyoto, JP;
Kumiko Yamashita, Hyogo, JP;
Aisin Seiki Kabushiki Kaisha, Aichi-ken, JP;
Abstract
A method for measuring a spectrum of a terahertz pulse includes generating a terahertz pulse using an ultrashort pulsed pumping light, generating a white light pulse using an ultrashort pulsed probe light, stretching and chirping the white light pulse modulating the chirped white light pulse such that the terahertz pulse and the chirped white light pulse irradiate into an electro-optic crystal synchronously, so that the chirped white light pulse is modulated by an electric field signal induced at the electro-optic crystal irradiated by the terahertz pulse, detecting a spectrum of chirped white light pulse modulated at the electro-optic modulating step by a multi-channeled detector, analyzing an electric field of the teraherz pulse irradiated to the electro-optic crystal from the spectrum of the chirped white light pulse detected by the multi-channeled spectrum detecting step, and transforming the analyzed electric field signal into a frequency spectrum of the terahertz pulse.