Incheon, South Korea

Heeyoun Kim

This inventor holds 4 USPTO granted patents and 2 published patent applications. Top assignee: Stats Chippac Pte. Ltd.. Active years: 2024-2026.

USPTO Granted Patents = 4 

% Patents Active = 50.0

Average Co-Inventor Count = 4.3

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2024-2026

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4 patents (USPTO):Explore Patents

Title: Heeyoun Kim: Innovator in Semiconductor Technology

Introduction

Heeyoun Kim is a prominent inventor based in Incheon, South Korea. He has made significant contributions to the field of semiconductor technology, holding 4 patents that showcase his innovative approach to device manufacturing.

Latest Patents

One of Heeyoun Kim's latest patents is a semiconductor device with a compartment shield formed from metal bars and its manufacturing method. This invention involves a semiconductor device that includes a substrate and first and second electrical components positioned over the substrate. A first metal bar is strategically placed between these components. The metal bar is created by placing a mask over a carrier, forming an opening in the mask, and sputtering a metal layer over it. Once the mask is removed, the metal layer remains within the opening, forming the first metal bar, which can be conveniently stored in a tape-and-reel.

Career Highlights

Heeyoun Kim is currently employed at Stats Chippac Pte. Ltd., where he continues to develop innovative semiconductor solutions. His work has been instrumental in advancing the technology used in electronic devices.

Collaborations

Heeyoun collaborates with talented coworkers, including YongKook Shin and Kyowang Koo, who contribute to the innovative environment at Stats Chippac Pte. Ltd.

Conclusion

Heeyoun Kim's contributions to semiconductor technology reflect his dedication to innovation and excellence in his field. His patents not only enhance the functionality of semiconductor devices but also pave the way for future advancements in technology.

Profile summary based on public USPTO records.
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