Corvallis, OR, United States of America

Haoran Duan


Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 14(Granted Patents)


Location History:

  • Corvallis, OR (US) (2007 - 2010)
  • Denver, CO (US) (2011)

Company Filing History:


Years Active: 2007-2011

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5 patents (USPTO):Explore Patents

Title: Haoran Duan: Innovator in Semiconductor Testing Technologies

Introduction

Haoran Duan is a prominent inventor based in Corvallis, OR (US), known for his contributions to the field of semiconductor testing technologies. With a total of 5 patents to his name, Duan has made significant advancements in the testing of system-on-chip (SoC) integrated circuits.

Latest Patents

Duan's latest patents include innovative solutions such as an on-chip test circuit and method for testing of system-on-chip integrated circuits. This invention discloses a system and method for testing IP cores contained in a SoC. The process involves receiving an operation command on an input/output port, which includes an operation code component, data components, and an expected time component. The command is processed to supply test data to each of the IP cores being tested, and result data is received in response. The processed result data generates a status data packet that includes the operation code component and a status flag component.

Another notable patent is the modular bonding pad structure and method. This invention describes a semiconductor die that includes multiple drivers and bonding pads. Each driver is formed by interconnected modules, with an associated bonding pad to which at least one module is electrically connected. The arrangement of bonding pads can be in a double- or triple-staggered pattern around the die's periphery.

Career Highlights

Throughout his career, Haoran Duan has worked with leading technology companies, including Marvell International Technology Ltd and Avago Technologies General IP (Singapore) Pte. Ltd. His experience in these organizations has contributed to his expertise in semiconductor technologies and testing methodologies.

Collaborations

Duan has collaborated with notable professionals in the field, including Charles Edward Evans and Michael Alvin Rencher. These collaborations have further enriched his work and innovations in semiconductor testing.

Conclusion

Haoran Duan's contributions to semiconductor testing technologies have established him as a key inventor in the industry. His innovative patents and collaborations reflect his commitment to advancing technology in this critical field.

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