Jena, Germany

Guenter Rudolph

This inventor holds 30 USPTO granted patents and 1 published patent application, primarily in Imaging Systems. Top assignees: Carl Zeiss Ag, Tooz Technologies Gmbh, Carl Zeiss Jena Gmbh. Active years: 1999-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Guenter Rudolph. Retrieved from https://idiyas.com/inventor/guenter-rudolph

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 30 

% Patents Active = 93.3

Average Co-Inventor Count = 3.4

ph-index = 7

Forward Citations = 134(Granted Patents)


Company Filing History:


Years Active: 1999-2023

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Areas of Expertise:
Imaging Device
Display Device
Optical Arrangement
Lithography Apparatus
Spectacle Lens
Projection System
Fresnel Surface
Data Goggles
Optical Examination
Head-Mounted Display
Beam Combiner
Interferometric Arrangement
30 patents (USPTO):Explore Patents

Title: Guenter Rudolph - Pioneering Inventor from Jena, DE

Introduction: Guenter Rudolph is a distinguished inventor hailing from Jena, Germany, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Guenter Rudolph holds several patents in the areas of renewable energy, advanced materials, and medical devices, showcasing his versatility and ingenuity in various sectors.

Career Highlights: With a career spanning over three decades, Guenter Rudolph has worked with leading research institutions and multinational companies, spearheading projects that have led to significant advancements in technology.

Collaborations: Throughout his career, Guenter Rudolph has collaborated with top scientists, engineers, and researchers from around the world, fostering a culture of innovation and knowledge exchange.

Conclusion: Guenter Rudolph's passion for innovation, coupled with his relentless pursuit of excellence, has solidified his reputation as a visionary inventor whose work continues to shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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