Griffin A P Hovorka

Title: Griffin A P Hovorka: Innovator in Snapshot Ellipsometry

Introduction

Griffin A P Hovorka is a notable inventor based in Lincoln, NE (US). He has made significant contributions to the field of optical measurement technology, particularly through his innovative work on ellipsometers. With a total of 3 patents to his name, Hovorka continues to push the boundaries of what is possible in this area.

Latest Patents

One of Hovorka's latest patents is the development of a snapshot ellipsometer. This device is designed to measure samples without the need for temporally modulated elements. Instead, it utilizes one or more spatially varying compensators, such as microretarder arrays and compound prisms, to alter the polarization state within a measurement beam of electromagnetic radiation. The analysis of the intensity profile of the beam, after it interacts with the compensators and the sample, allows for the characterization of sample parameters without the use of moving optics.

Career Highlights

Hovorka is currently employed at J.A. Woollam Co., a company known for its expertise in optical measurement technology. His work there has been instrumental in advancing the capabilities of ellipsometry and polarimetry.

Collaborations

Throughout his career, Hovorka has collaborated with several talented individuals, including Jeremy A Van Derslice and Martin M Liphardt. These collaborations have contributed to the innovative developments in his field.

Conclusion

Griffin A P Hovorka is a pioneering inventor whose work in snapshot ellipsometry has the potential to revolutionize optical measurements. His contributions continue to influence the industry and inspire future innovations.