The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2022
Filed:
Apr. 06, 2020
Griffin A. P. Hovorka, Lincoln, NE (US);
Jeremy A. Van Derslice, Dwight, NE (US);
Martin M. Liphardt, Lin Coln, NE (US);
Griffin A. P. Hovorka, Lincoln, NE (US);
Jeremy A. Van Derslice, Dwight, NE (US);
Martin M. Liphardt, Lin Coln, NE (US);
J.A. WOOLLAM CO., INC., Lincoln, NE (US);
Abstract
A snapshot ellipsometer or polarimeter which does not require temporally modulated element(s) to measure a sample, but instead uses one or more spatially varying compensators, (eg. microretarder arrays and compound prisms), to vary the polarization state within a measurement beam of electromagnetic radiation. Analysis of an intensity profile of the beam after interaction with the spatially varying compensator(s) and the sample, and after having source beam wavelength content determined using a digital light processor, and/or being directed by a digital light processor elements toward elements in the detector, allows sample parameters to be characterized.