Grant W Wagner

Title: Grant W. Wagner: Innovator in Wafer Testing Technology

Introduction

Grant W. Wagner, a prominent inventor based in Burlington, VT, holds an impressive portfolio of 32 patents. His innovations predominantly focus on advancing wafer testing technologies, which play a crucial role in the semiconductor industry. His work has contributed significantly to the reliability and efficiency of microcircuit testing.

Latest Patents

Among his latest innovations, Wagner introduced a "Compliant Wafer Probe Assembly." This invention features a wafer test device equipped with a conformal laminate and rigid probes designed to establish electrical connections with microcircuits under test. A notable aspect of this patent includes a spring plate located opposite to the probes, incorporating a conformal inner frame and a rigid outer frame. This design enhances the overall functionality and efficiency of the testing process.

Another significant patent from Wagner is the "Wafer Probe with Elastomer Support." This invention provides a sophisticated test interconnect to interface with a microcircuit at one end, while an interposer connects to the test interconnect at the opposite end. The interposer utilizes a printed circuit board (PCB) to channel connections to a testing apparatus, ensuring the application of precise test patterns to the microcircuit. To support the interconnect and interposer, a robust support structure with an inner bearing is featured, facilitating alignment with the microcircuit's surface. An elastomer included in the design minimizes deflection during connections, thereby optimizing performance.

Career Highlights

Throughout his career, Grant W. Wagner has made significant contributions while working with prestigious organizations. Notably, he has been associated with International Business Machines Corporation (IBM) and The United States of America as represented by the National Security Agency. His inventive contributions have positioned him as a key figure in the development of advanced testing solutions in the industry.

Collaborations

Wagner's journey includes collaborative efforts with distinguished coworkers, such as David Michael Audette and Pankaj Rohatgi. Their combined expertise and innovative spirit have fostered a dynamic environment, leading to impactful advancements in wafer testing technologies.

Conclusion

Grant W. Wagner exemplifies the spirit of innovation through his extensive contributions to the field of semiconductor testing. His recent patents reflect a deep understanding of the complexities involved in microcircuit testing, ensuring that testing processes are efficient and reliable. As technology continues to evolve, Wagner's work will undoubtedly influence future advancements in the industry.