The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
Mar. 12, 2020
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Charles L. Arvin, Poughkeepsie, NY (US);
David M. Audette, Colchester, VT (US);
Dennis R. Conti, Essex Junction, VT (US);
Brian M. Erwin, Millbrook, NY (US);
Grant Wagner, Jericho, VT (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); B23K 26/26 (2014.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2889 (2013.01); B23K 26/26 (2013.01); G01R 1/06761 (2013.01); G01R 31/2896 (2013.01);
Abstract
An integrated circuit (IC) device tester includes contact probes. A liner is formed upon the contact probes. The liner includes a matrix of metal particles and glass particles. The metal particles of the liner allow the contact probe to pass an electrical current through the liner. The glass particles of the liner prevent C4 material from adhering to the liner.