Gijs Van Duinen

Title: Gijs Van Duinen: Innovator in Cryogenic Technology

Introduction

Gijs Van Duinen is a prominent inventor based in Utrecht, Netherlands. He has made significant contributions to the field of cryogenic technology, holding a total of 4 patents. His work primarily focuses on advancements in charged particle microscopy.

Latest Patents

Among his latest patents is a cryogenic cell designed for mounting specimens in a charged particle microscope. This innovative approach enhances the examination of cryogenic specimens, allowing for more precise analysis. Another notable patent involves a method for aligning a featureless thin film in a Transmission Electron Microscope (TEM). This method is crucial for preparing Hole-Free Phase Plates (HFPP), ensuring high accuracy in the diffraction plane of the TEM. Two techniques are described for achieving this alignment, one utilizing a Ronchigram and the other relying on electron scattering.

Career Highlights

Gijs Van Duinen has established himself as a key figure in his field through his work at FEI Company. His expertise in cryogenic technology and microscopy has led to advancements that benefit researchers and industries alike.

Collaborations

He collaborates with talented coworkers such as Ivan Lazic and Bart Jozef Janssen, contributing to a dynamic and innovative work environment.

Conclusion

Gijs Van Duinen's contributions to cryogenic technology and charged particle microscopy exemplify the impact of innovative thinking in scientific research. His patents reflect a commitment to advancing technology and enhancing the capabilities of microscopy.