Gary William Maier

USPTO Granted Patents = 20 (Patent Applications = 2)

Average Co-Inventor Count = 4.0

ph-index = 6

Forward Citations = 118(Granted Patents)

Location History:

Burlington, VT (US) (2003 - 2004)
Poughquay, NY (US) (2004)
Poughquag, NY (US) (2010 - 2013)
Poughkeepsie, NY (US) (2015 - 2022)

Company Filing History:

19 out of 164,108

International Business Machines Corporation

Years Active: 2003-2022

where 'Filed Patents' based on already Granted Patents

20 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 11226372 - Portable chip tester with integrated field programmable gate array (2022-01-18),

2. 10768230 - Built-in device testing of integrated circuits (2020-09-08),

3. 10254336 - Iterative N-detect based logic diagnostic technique (2019-04-09),

4. 10169510 - Dynamic fault model generation for diagnostics simulation and pattern generation (2019-01-01),

5. 10043723 - Method of forming a temporary test structure for device fabrication (2018-08-07),

6. 10024910 - Iterative N-detect based logic diagnostic technique (2018-07-17),

7. 9997424 - Method of forming a temporary test structure for device fabrication (2018-06-12),

8. 9899280 - Method of forming a temporary test structure for device fabrication (2018-02-20),

9. 9852245 - Dynamic fault model generation for diagnostics simulation and pattern generation (2017-12-26),

10. 9735071 - Method of forming a temporary test structure for device fabrication (2017-08-15),

11. 9552449 - Dynamic fault model generation for diagnostics simulation and pattern generation (2017-01-24),

12. 9189037 - Optimizing heat transfer in 3-D chip-stacks (2015-11-17),

13. 9047938 - Phase change memory management (2015-06-02),

14. 9029234 - Physical design symmetry and integrated circuits enabling three dimentional (3D) yield optimization for wafer to wafer stacking (2015-05-12),

15. 8542030 - Three-dimensional (3D) stacked integrated circuit testing (2013-09-24),

Title: Innovations and Contributions of Gary William Maier

Introduction

Gary William Maier, based in Poughquag, NY, is a prolific inventor with an impressive portfolio that boasts 20 patents. His work focuses on advancing technology in the field of integrated circuits and chip testing. With a strong background in both industry and research, he has contributed significantly to the development of innovative solutions that enhance technological efficiency.

Latest Patents

Among Gary's most notable inventions are two patents related to chip testing. The first, titled "Portable Chip Tester with Integrated Field Programmable Gate Array," outlines a system designed for testing devices under a specific protocol. This invention includes key components such as a housing, a printed circuit board, an integrated circuit, a power supply, and a software platform with computer-readable instructions. This setup facilitates efficient testing and management of devices under trial.

Another groundbreaking patent, titled "Built-In Device Testing of Integrated Circuits," presents a computer-implemented method for the testing, characterization, and diagnostics of integrated circuits. This system employs an adaptive microcontroller, which allows the testing program to modify parameters based on the results obtained, significantly improving the testing efficiency and adaptability.

Career Highlights

Gary's professional journey includes substantial contributions at prominent technology companies. He has worked with IBM, where he contributed to various projects that advanced the company's technological capabilities. Additionally, his experience at Globalfoundries Inc. further underscores his impact on the microelectronics industry.

Collaborations

Throughout his career, Gary has collaborated with talented professionals, including Phong T Tran and Mary Prilotski Kusko. These collaborations have fostered an environment of innovation, allowing for the development of cutting-edge technologies in chip testing and beyond.

Conclusion

Gary William Maier's contributions to the field of integrated circuits and chip testing are noteworthy. With 20 patents to his name, his innovations continue to shape the landscape of technology. His work, marked by collaboration and expertise, reflects a commitment to advancing industry standards and improving device testing methodologies. The impact of his inventions is felt not only in corporate settings but also in the broader realm of technology development.

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2 patents pending:

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