Location History:
- Hyogo, JP (1998 - 1999)
- Tokyo, JP (2000 - 2004)
Company Filing History:
3 out of 21,351 
2 out of 52 
1 out of 3,781 
Years Active: 1998-2004
Title: Fumihito Ohta: Innovator in Failure Analysis Technology
Introduction
Fumihito Ohta is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of failure analysis technology, holding a total of 4 patents. His innovative approaches have advanced the methods used to classify and analyze failures in electronic systems.
Latest Patents
Ohta's latest patents include a failure analysis method that allows for high-precision failure mode classification. This method generates an original Failure Bit Map (FBM) based on predetermined tests using an LSI tester. The FBM is then compressed to identify areas where failure bits exist. Additionally, he has developed a failure analysis system that automates the extraction of fatal failures based on accumulated FBM information. This system continuously performs repair judgment processing to address failures in both X-line and Y-line directions, enhancing the efficiency of failure investigations.
Career Highlights
Throughout his career, Ohta has worked with notable companies such as Mitsubishi Electric Corporation and Ryoden Semiconductor System Engineering Corporation. His experience in these organizations has allowed him to refine his expertise in failure analysis and contribute to the development of advanced technologies.
Collaborations
Ohta has collaborated with esteemed colleagues, including Toshikazu Tsutsui and Tohru Koyama. These partnerships have fostered innovation and have been instrumental in the success of his projects.
Conclusion
Fumihito Ohta's work in failure analysis technology exemplifies his commitment to innovation and excellence. His patents and career achievements reflect his significant impact on the industry.