The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2004
Filed:
Nov. 06, 2002
Applicant:
Inventor:
Fumihito Ohta, Tokyo, JP;
Assignee:
Renesas Technology Corp., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract
A failure analysis method is provided that allows high-precision failure mode classification. Based on the result of a predetermined test using an LSI tester ( ), an original FBM ( ) is generated. The FBM ( ) is compressed with 8×8 bits per pixel to generate an FBM ( ). Based on the FBM ( ), an area where a failure bit exists in the FBM ( ) is determined. Then, by compressing a portion of the FBM ( ) which corresponds to the above area with 2×2 bits per pixel, FBMs ( ) are generated. Based on the FBMs ( ), failure bits are determined.