This inventor holds 3 USPTO granted patents. Top assignee: Credence Systems Corporation. Active years: 2006-2007.
Company Filing History:
Years Active: 2006-2007
Title: Frederic Giral: Innovator in Test Instrument Synchronization
Introduction
Frederic Giral is a notable inventor based in Pourcieux, France. He has made significant contributions to the field of test instrumentation, holding a total of 3 patents. His work focuses on the synchronization of multiple test instruments, which is crucial for accurate data collection and analysis.
Latest Patents
Giral's latest patents include innovative methods for synchronizing test instruments. One of his patents describes a test apparatus that allows multiple instruments to be synchronized with respect to one another. This synchronization enables a trigger signal to be generated in response to events occurring at different instruments. Each instrument generates a partial trigger signal, which is then used to create a comprehensive trigger signal. Different offset delays are applied to ensure that these signals are synchronized effectively.
Another patent by Giral also addresses the synchronization of multiple test instruments. In this invention, the test data generated by the instruments is ensured to arrive at the pins of a device under test at the specified time in a test program. This is achieved by introducing varying delays to the triggers generated by each instrument, based on their individual transmission and processing delays.
Career Highlights
Frederic Giral is currently associated with Credence Systems Corporation, where he continues to innovate in the field of test instrumentation. His expertise in synchronization techniques has positioned him as a valuable asset in his company.
Collaborations
Giral has collaborated with notable colleagues such as Jean-Claude Fournel and William A Fritzsche. Their combined efforts contribute to advancements in the technology surrounding test instruments.
Conclusion
Frederic Giral's work in synchronizing test instruments has led to significant advancements in the field. His patents reflect a deep understanding of the complexities involved in test data collection and processing. Through his contributions, he continues to influence the industry positively.