The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2007
Filed:
Dec. 01, 2004
Frederic Giral, Pourcieux, FR;
Jean-claude Fournel, St Didier en Velay, FR;
Frederic Giral, Pourcieux, FR;
Jean-Claude Fournel, St Didier en Velay, FR;
Credence Systems Corporation, Milpitas, CA (US);
Abstract
A test apparatus has multiple instruments that are synchronized with respect to one another so that a trigger signal may be generated in response to events occurring at different instruments. The events may correspond to events defined within a test program or events detected at a device under test. A partial trigger signal is generated by each of the different instruments, and the partial trigger signals are used in generating the trigger signal. Different offset delays are applied to the partial trigger signals so that the partial trigger signals generated by the different instruments are synchronized with respect to each other.