The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2006
Filed:
Oct. 01, 2004
Applicants:
Frederic Giral, Pourcieux, FR;
Jean-claude Fournel, St Didier en Velay, FR;
Inventors:
Frederic Giral, Pourcieux, FR;
Jean-Claude Fournel, St Didier en Velay, FR;
Assignee:
Credence Systems Corporation, Milpitas, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 19/00 (2006.01); G01L 15/00 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test apparatus has multiple instruments that are synchronized with respect to one another so that test data generated by them arrive at the pins of a device under test at the time specified in a test program. The synchronization of the multiple instruments is carried out by introducing delays to triggers that are generated and used by the multiple instruments. The amount of delay that is introduced varies from instrument to instrument and is based on differences in the actual transmission and processing delays and clock rates.