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Mountain View, CA, United States of America

Fidel Muradali

USPTO Granted Patents = 7

Average Co-Inventor Count = 1.7

ph-index = 5

Forward Citations = 173(Granted Patents)

Company Filing History:

Agilent Technologies, Inc.

National Semiconductor Corporation

Years Active: 2001-2011

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7 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7863923 - Adaptive test time reduction for wafer-level testing (2011-01-04),

2. 7626412 - Adaptive test time reduction for wafer-level testing (2009-12-01),

3. 6941498 - Technique for debugging an integrated circuit having a parallel scan-chain architecture (2005-09-06),

4. 6751768 - Hierarchical creation of vectors for quiescent current (IDDQ) tests for system-on-chip circuits (2004-06-15),

5. 6714036 - Monitor circuitry and method for testing analog and/or mixed signal integrated circuits (2004-03-30),

6. 6587981 - Integrated circuit with scan test structure (2003-07-01),

7. 6191603 - Modular embedded test system for use in integrated circuits (2001-02-20),

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