This inventor holds 7 USPTO granted patents. Top assignees: Agilent Technologies, Inc., National Semiconductor Corporation. Active years: 2001-2011.
Company Filing History:
5 out of 4,729 
2 out of 4,791 
Years Active: 2001-2011
Title: Innovations by Inventor Fidel Muradali
Introduction
Fidel Muradali is a notable inventor based in Mountain View, CA. He has made significant contributions to the field of testing methodologies, particularly in the semiconductor industry. With a total of 7 patents to his name, Muradali's work focuses on enhancing the efficiency of wafer-level testing.
Latest Patents
One of his latest patents is titled "Adaptive test time reduction for wafer-level testing." This method involves applying a default test sequence to a series of consecutively indexed sites until a defective site is identified. Upon identifying the first defective site, a more stringent test sequence is applied to a predefined number of sites following the defective site. If this stringent test does not reveal a second defective site, the default test sequence resumes. Another significant patent by Muradali is also related to adaptive test time reduction. This method dynamically adjusts the amount of test data applied to die locations on a wafer under test. As locations are tested, the amount of test stimuli for subsequent locations is modified based on previous results. This approach allows for more thorough testing in areas likely to fail while reducing testing in other regions, ultimately decreasing overall testing time.
Career Highlights
Fidel Muradali has worked with prominent companies in the technology sector, including Agilent Technologies, Inc. and National Semiconductor Corporation. His experience in these organizations has contributed to his expertise in testing methodologies and innovations in semiconductor technology.
Collaborations
Some of his notable coworkers include Neal C. Jaarsma and Robert Campbell Aitken. Their collaboration has likely fostered an environment of innovation and shared knowledge in their respective fields.
Conclusion
Fidel Muradali's contributions to wafer-level testing methodologies demonstrate his commitment to innovation in the semiconductor industry. His patents reflect a deep understanding of testing processes and a drive to improve efficiency.