The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2003
Filed:
Nov. 29, 1999
Applicant:
Inventors:
Fidel Muradali, Mountain View, CA (US);
Neal C. Jaarsma, Corvallis, OR (US);
Assignee:
Agilent Technologies, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G01R 3/13185 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G01R 3/13185 ;
Abstract
Scan path structures are provided for integrated circuits which contain one or more cores or levels of sub-cores embedded within the cores. Circuitry is provided to permit scan testing of scan elements, such as scan wrapper cells and scan chains, in the cores and sub-cores by providing scan paths which share access to limited numbers of scan test ports of the integrated circuit under test. This solves the problem of having sufficient scan ports at the integrated circuit boundaries for the increasingly higher number of scan paths which require access to these scan ports.