The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2009
Filed:
Sep. 05, 2007
Fidel Muradali, Mountain View, CA (US);
Fidel Muradali, Mountain View, CA (US);
National Semiconductor Corporation, Santa Clara, CA (US);
Abstract
A method is provided for dynamically increasing or decreasing the amount of test data that is applied to die locations on a wafer under test. As on-wafer locations are traversed and tested, the amount of test stimuli applied to subsequent locations is adjusted. This adjustment is based upon the results of previously tested locations. The effect is that the test program detects regions of the wafer that are more likely to fail and applies more complete testing to these areas. Other areas of the wafer may receive reduced testing. By automatically adapting the test mix to suit the potential failure patterns, wafer testing time is reduced.