Company Filing History:
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Years Active: 2008-2011
Title: Eswar Vadlamani: Innovator in Built-In Self-Test Technologies
Introduction
Eswar Vadlamani is a notable inventor based in Hyderabad, Telangana, India. He has made significant contributions to the field of electronics, particularly in the development of built-in self-test (BIST) technologies. With a total of 2 patents to his name, Vadlamani's work has had a considerable impact on fault detection and data transmission systems.
Latest Patents
Vadlamani's latest patents include a "Programmable address space built-in self-test (BIST) device and method for fault detection." This innovative circuit is designed for testing addressable locations and includes a BIST generator that generates test addresses for each location. Defective addresses are stored in a fault address store, and an address range selector circuit limits the range of addresses generated. This allows for comprehensive testing of an entire address range, regardless of the depth of the fault address store.
Another significant patent is the "Parallel input/output self-test circuit and method." This system features a receiver section with input selector circuits that provide received test data to logic adjust circuits. These circuits align multiple incoming test values to eliminate intentionally introduced logic differences. The result combining circuit logically combines output data values, providing a resulting sequence to a pattern sequence test circuit.
Career Highlights
Eswar Vadlamani has worked with prominent companies in the semiconductor industry, including NetLogic Microsystems, Inc. and Cypress Semiconductor Corporation. His experience in these organizations has allowed him to refine his skills and contribute to cutting-edge technologies in the field.
Collaborations
Vadlamani has collaborated with talented individuals such as Gopalakrishnan Perur Krishnan and Ramesha Doddamane. These collaborations have further enriched his work and innovation in the electronics sector.
Conclusion
Eswar Vadlamani is a distinguished inventor whose contributions to built-in self-test technologies have advanced the field of electronics. His patents reflect a commitment to innovation and excellence in fault detection and data transmission systems.