Location History:
- Fontenay le Vicomte, FR (2017 - 2019)
- Moissy-Cramayel, FR (2021)
Company Filing History:
5 out of 354 
1 out of 1,856 
Years Active: 2017-2021
Title: Estelle Parra: Innovator in Non-Intrusive Measurement Technologies
Introduction
Estelle Parra is a notable inventor based in France, recognized for her contributions to the field of non-intrusive measurement technologies. With a focus on innovative methods for analyzing materials, she has developed techniques that enhance the understanding of composite materials and their properties. Although she currently holds 5 patents, her work demonstrates significant potential in advancing measurement methodologies.
Latest Patents
Estelle Parra's latest inventions include two significant patents. The first, titled "Mesure Non Intrusive De La Densite Volumique D'une Phase Dans Une Piece," involves a method and system for non-intrusively measuring the volume density of a specific phase in a part. This invention utilizes processing means to create a three-dimensional image of the part, allowing for the analysis of the arrangement of the specific phase within it. The second patent, "Procede Et Dispositif D'estimation D'un Indice De Qualite D'une Image 3d D'une Piece De Materiau Composite," focuses on estimating a quality index of a 3-D image of composite material. This method includes steps for obtaining a histogram from the image and estimating quality indices based on Gaussian parameters extracted from the histogram.
Career Highlights
Throughout her career, Estelle Parra has demonstrated a commitment to innovation in measurement technologies. Her work has the potential to impact various industries by providing more accurate and efficient methods for analyzing materials.
Collaborations
Estelle has collaborated with Vincent Morard, contributing to the development of her innovative technologies. Their partnership highlights the importance of teamwork in advancing research and innovation.
Conclusion
Estelle Parra is an emerging inventor whose work in non-intrusive measurement technologies showcases her innovative spirit and dedication to advancing material analysis. Her contributions, although not yet patented, reflect a promising future in the field of measurement methodologies.