The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Mar. 16, 2018
Safran, Paris, FR;
Haithem Boussaid, Moissy-Cramayel, FR;
Estelle Parra, Moissy-Cramayel, FR;
SAFRAN, Paris, FR;
Abstract
A method for the non-destructive examination of aeronautical parts utilizing a system for acquiring x-ray images of the aeronautical parts, the method including verifying the system for acquiring x-ray images of the aeronautical parts, the verification including the steps of: acquiring an x-ray image of a known reference part including predefined structures, recognizing the predefined structures of the known reference part in the acquired x-ray image, measuring image quality on the basis of the result of the recognition step, wherein the recognition of the predefined structures of the known reference part in the acquired x-ray image includes the steps of: using information extracted from the acquired image in order to produce first structure information, and combining the first structure information with information representing a priori knowledge of the structures, by modelling using a Markov chain, in order to produce second structure information.