The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

May. 22, 2015
Applicants:

Safran Aircraft Engines, Paris, FR;

Safran, Paris, FR;

Inventors:

Vincent Morard, Versailles, FR;

Estelle Parra, Fontenay Le Vicomte, FR;

Julien Schneider, Moissy-Cramayel, FR;

David Tourais, Paris, FR;

Assignees:

SAFRAN AIRCRAFT ENGINES, Paris, FR;

SAFRAN, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06K 9/4647 (2013.01); G06T 7/0002 (2013.01); G06T 7/0004 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/30164 (2013.01); G06T 2207/30168 (2013.01);
Abstract

The method of estimating a quality index of a gray-scale encoded three-dimensional image of a composite material part includes an obtaining step for obtaining a histogram from the image, the histogram representing for each class of a plurality of classes each including at least one gray-scale level, the number of voxels of the image having a gray-scale level belonging to the class; an extraction step for extracting a predetermined number of Gaussian functions present in the histogram; and an estimation step for estimating at least one quality index of the image from parameters characterizing the Gaussian functions extracted from the histogram.


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