The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
Dec. 03, 2014
Safran, Paris, FR;
SAFRAN, Paris, FR;
Abstract
Method and system for non-intrusive measurement of volume density of a specific phase in a part, comprising: processor producing a volume image of the part, the image being formed by a three-dimensional grid of voxels, the values of which indicate the disposition of the specific phase in the part, processor associating a binary coefficient with each voxel of the volume image, thus constructing an initial three-dimensional matrix representation of binary coefficients representing a presence or absence of the specific phase in zones of the part corresponding to the voxels, processor convoluting the initial matrix representation with a convolution matrix kernel corresponding to a predetermined reference volume, the convolution performed by effecting a composition of three (successive) monodimensional convolutions in three independent directions, thus forming a resultant matrix representation, each resultant coefficient of which represents a volume ratio (the density) of the specific phase in the reference volume.