Eindhoven, Netherlands

Eray Uzgören

This inventor holds 1 USPTO granted patent. Top assignees: Asml Holding N.v., Asml Netherlands B.v.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eray Uzgören. Retrieved from https://idiyas.com/inventor/eray-uzgören

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 19.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Eray Uzgören: Innovator in Lithographic Systems

Introduction

Eray Uzgören is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of lithography, particularly with his innovative patent that addresses the challenges of particulate debris in radiation systems.

Latest Patents

Uzgören holds a patent for a "Lithographic system provided with a deflection apparatus for changing a trajectory of particulate debris." This invention includes a radiation receiving apparatus equipped with an opening that allows radiation from a source to pass through. The deflection apparatus is designed to alter the trajectory of particles entering the radiation receiving apparatus, thereby enhancing the efficiency and effectiveness of lithographic processes.

Career Highlights

Throughout his career, Eray Uzgören has worked with prominent companies in the technology sector. He has been associated with ASML Holding N.V. and ASML Netherlands B.V., where he has contributed to advancements in lithographic technology.

Collaborations

Uzgören has collaborated with notable professionals in his field, including Ronald Peter Albright and Kursat Bal. These collaborations have likely enriched his work and contributed to the development of innovative solutions in lithography.

Conclusion

Eray Uzgören's contributions to lithographic systems demonstrate his commitment to innovation and excellence in technology. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to improving lithographic processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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