En Hong

Title: En Hong: Innovator in Defect Detection Technologies

Introduction

En Hong is a notable inventor based in Painted Post, NY (US), recognized for his contributions to the field of defect detection technologies. With a total of 7 patents to his name, he has made significant advancements that enhance the inspection processes in various materials.

Latest Patents

One of his latest patents is titled "Apparatus and method for inspecting laser defect inside of transparent material." This innovative method involves directing light from an illumination source onto defects in a transparent workpiece. The process includes detecting a scattering image signal from light scattered by these defects and generating a three-dimensional image based on the scattering signal. Another significant patent is the "System and method for detecting defects in a honeycomb body." This system utilizes a nozzle to deliver a CO-particulate fluid to detect defects in plugged honeycomb bodies by monitoring the CO-particulate flow at the outlet end.

Career Highlights

En Hong has worked with prominent companies such as Corning Incorporated and Corning Optical Communications LLC. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to the advancement of defect detection technologies.

Collaborations

Throughout his career, En Hong has collaborated with talented individuals, including Philip Robert LeBlanc and Garrett Andrew Piech. These collaborations have fostered a creative environment that has led to the development of groundbreaking technologies.

Conclusion

En Hong's work in defect detection technologies showcases his innovative spirit and dedication to improving inspection methods. His contributions continue to influence the industry and pave the way for future advancements.