Corning Incorporated

Corning Optical Communications LLC

En Hong

Philip Robert LeBlanc

Garrett Andrew Piech

Correy Robert Ustanik

Michael Brian Webb

Rajeshkannan Palanisamy

Uta-Barbara Goers

Chong Pyung An

Elvis Alberto Zambrano

John Joseph Costello, Iii

Sterling Michael Clarke

Sung-chan Hwang

Ji Hwa Jung

Tae-ho Keem

Sung-jong Pyo

Yuhui Jin

Joseph Henry Citriniti

Michal Mlejnek

Tian Huang

Johannes Moll

Amanda Kathryn Thomas

Hyeong-cheol Lee

A method for inspecting a transparent workpiece comprises: directing light from an illumination source onto a plurality of defects formed in the transparent workpiece, wherein the plurality of defects extends in a defect direction, wherein the transparent workpiece comprises a first surface and a second surface; detecting a scattering image signal from light scattered by the plurality of defects using an imaging system, wherein an imaging axis of the imaging system extends at a non-zero imaging angle relative to the defect direction, wherein entireties of at least a subset of the plurality of defects are within a depth of field of the imaging system; and generating a three-dimensional image of at least one of the plurality of defects based on the scattering signal.

Apparatus and method for inspecting laser defect inside of transparent material

Defect detection systems include at least one nozzle for delivering a COparticulate fluid to an inlet end of a plugged honeycomb body. Defects in the honeycomb, if any, are determined by monitoring COparticulate flow at the outlet end of the honeycomb body. Methods for detecting defects in plugged honeycomb bodies are also disclosed.

System and method for detecting defects in a honeycomb body

A method of inspecting defects on a transparent substrate may include: selecting a gradient of an illumination optical system so that light incident on the transparent substrate has a first angle; selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle; adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light meets a second surface of the transparent substrate, the second surface being opposite to the first surface; illuminating the transparent substrate; and detecting light scattered from the transparent substrate.

Method and apparatus for inspecting defects on transparent substrate and method emitting incident light

A method of inspecting defects of a transparent substrate may include: illuminating a transparent substrate; calculating an incidence angle range of light so that a first region where the light meets a first surface of the transparent substrate and a second region where light meets a second surface being opposite the first surface of the transparent substrate do not overlap each other; adjusting an incidence angle according to the incidence angle range; adjusting a position of a first detector so that a first field-of-view of the first detector covers the first region and does not cover the second region; adjusting a position of a second detector so that a second field-of-view of the second detector covers the second region and does not cover the first region; and obtaining a first image of the first region and a second image of the second region from the first and second detector, respectively.

Method and apparatus for inspecting defects on transparent substrate

Systems and methods of measuring ferrule-core concentricity for an optical fiber held by a ferrule are disclosed. The method includes: generating ferrule distance data by measuring distances to a ferrule outside surface as a function of rotation angle using a distance sensor and rotating either the ferrule or the distance sensor about an axis of rotation that is off-center from the true ferrule axis; aligning the axis of rotation with the fiber core; using the ferrule distance data to determine a position of the true ferrule center relative to the optical fiber core; and measuring the concentricity as the distance between the true center of the ferrule and the optical fiber core.

Ferrule-core concentricity measurement systems and methods

A method for determining surface quality for a glass surface is provided. The method includes depositing a pattern of drops over the glass surface using a drop dispensing apparatus. Adjacent drops have a predetermined deposit size and a predetermined deposit spacing. Drop information for the pattern of drops is generated using a vision apparatus. An out-of-parameter condition is detected by analyzing the drop information and an indication of the out-of-parameter condition is provided.

Apparatus and methods for determining surface compliance for a glass surface

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Painted Post, NY, United States of America

En Hong