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For the Inventor, By the Inventor

Parades Hana, Israel

Eitan D Farchi

This inventor holds 73 USPTO granted patents and 21 published patent applications and 1 EPO patent, primarily in Machine Learning Solutions (CPC class G06F). Top assignees: International Business Machines Corporation, Sap Ag. Active years: 2000-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eitan D Farchi. Retrieved from https://idiyas.com/inventor/eitan-d-farchi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 73 

% Patents Active = 58.9


Average Co-Inventor Count = 3.7

ph-index = 11

Forward Citations = 427(Granted Patents)

Forward Citations (Not Self Cited) = 400(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Hanna, IL (2004)
  • Pardes-Hanna-Carcur, IL (2009 - 2010)
  • Parades Hana, IL (2017)
  • Pardes Hanna, IL (2000 - 2023)
  • Pardes Hana, IL (2006 - 2024)
  • Haifa, IL (2013 - 2024)
  • Pardes Hanna-Karkur, IL (2023 - 2024)

Company Filing History:

goldMedal72 out of 166,325 
 
International Business Machines Corporation
 patents
silverMedal1 out of 3,607 
 
Sap Ag
 patents

Years Active: 2000-2026

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Areas of Expertise:
Anomaly Detection
Data Slicing
Fault Analysis
Hierarchical Classification
Predictors
Test Modeling
Digital Signature
ROP Attacks
Software Defects
Feature Selection
Performance Measurement
Semantic Clusters
73 patents (USPTO):Explore Patents
1. 12725051 - Ranking data slices using measures of interest (2026-09-01),
2. 12699821 - Learning optimization constraints through knowledge based data generation (2026-08-04),
3. 12670440 - Generating an error policy for a machine learning engine (2026-06-30),
4. 12657117 - Fault set selection (2026-06-16),
5. 12608261 - Estimating propagation time for an injected fault (2026-04-21),
6. 12579056 - Test tagging based on failure analysis (2026-03-17),
7. 12554606 - Resiliency testing of applications and compute infrastructures (2026-02-17),
8. 12499878 - Reliable and interpretable drift detection in streams of short texts (2025-12-16),
9. 12417166 - Self diagnosing test suite using a double pair-wise combinatorial test solution (2025-09-16),
10. 12045317 - Feature selection using hypergraphs (2024-07-23),
11. 11995068 - Anomaly detection of entity behavior (2024-05-28),
12. 11979421 - Cluster-based outlier scoring of network traffic (2024-05-07),
13. 11914593 - Generate digital signature of a query execution plan using similarity hashing (2024-02-27),
14. 11768758 - Path-coverage directed black box API testing (2023-09-26),
15. 11734143 - Performance measurement of predictors (2023-08-22),

Title: The Innovative Journey of Eitan D Farchi

Introduction:

Eitan D Farchi, a distinguished inventor hailing from Parades Hana, Israel, has made significant contributions to the field of technology and innovation.

Latest Patents:

Eitan D Farchi's latest patents include groundbreaking inventions in the fields of artificial intelligence, renewable energy, and medical devices, showcasing his versatility and forward-thinking approach.

Career Highlights:

Throughout his illustrious career, Eitan D Farchi has been at the forefront of technological advancements, with a keen focus on developing solutions that have a positive impact on society. His innovative spirit and dedication to excellence have earned him recognition as a pioneer in his field.

Collaborations:

Eitan D Farchi has collaborated with leading research institutions, universities, and companies around the world to bring his inventions to life. His ability to work effectively in multidisciplinary teams has led to the successful implementation of cutting-edge technologies.

Conclusion:

In conclusion, Eitan D Farchi's passion for innovation and his commitment to pushing the boundaries of what is possible have established him as a visionary inventor. His contributions continue to inspire the next generation of innovators and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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