The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Sep. 26, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Andrew C. M. Hicks, Highland, NY (US);

Deborah A. Furman, Staatsburg, NY (US);

Eitan Daniel Farchi, Haifa, IL;

James A O'connor, Ulster Park, NY (US);

Michael E Gildein, Wappingers Falls, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/3668 (2025.01); G06F 11/3698 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3692 (2013.01); G06F 11/3684 (2013.01); G06F 11/3688 (2013.01); G06F 11/3698 (2025.01);
Abstract

Tagging a corpus of tests based upon failure analysis. Access tags associated with test cases known to execute without error against an original corpus of source code. Access a test set associated with the accessed tags, the test set containing test cases. Access a new corpus of source code to be tested. Execute the new corpus of source code using test cases from the accessed test set. Access errors generated by execution of the new corpus of source code using the test cases. Determine locations in the new corpus of source code associated with the accessed errors. Execute natural language processing software to generate new tags associated with the locations in the new corpus of source code associated with the accessed errors.


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