The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2025
Filed:
Mar. 31, 2023
International Business Machines Corporation, Armonk, NY (US);
Dale E. Blue, Poughkeepsie, NY (US);
Andrew C. M. Hicks, Highland, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
Eitan Daniel Farchi, Pardes Hana, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Techniques for testing and fault detection are disclosed. These techniques include generating a set of test cases for a system under test (SUT), the set of test cases based on attribute-value pairs modeled as input to the SUT. The techniques further include augmenting the set of test cases. This includes locating a missing counterpart for a first combination of values in a first test case in the set of test cases, based on identifying a number of instances of the first combination of values in the set of test cases, generating a new test case based on modifying the first test case to act as the missing counterpart, and adding the new test case to the set of test cases. The techniques further include identifying a fault for the SUT based on executing the augmented set of test cases.