The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Jun. 27, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Mudit Verma, New Delhi, IN;

Harshit Kumar, New Delhi, IN;

Sandeep Hans, New Delhi, IN;

Ruchi Mahindru, Elmsford, NY (US);

Praveen Jayachandran, Bangalore, IN;

Eitan Daniel Farchi, Haifa, IL;

Diptikalyan Saha, Bangalore, IN;

Mudhakar Srivatsa, White Plains, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/3668 (2025.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3476 (2013.01);
Abstract

Embodiments receive a plurality of faults for at least one microservice in a cloud native based application within a fault set selection server; inject the faults into at least one microservice in the cloud native based application within the fault set selection server; obtain a system state representation for each of the injected faults in the at least one microservice in the cloud native based application using an unsupervised clustering algorithm; derive a fault subset based on the system state representation for each the faults in the at least one microservice in the cloud native based application; and inject the derived fault subset into the at least one microservice in the cloud native based application and logging behavior of the at least one microservice in the cloud native based application with the injected derived fault subset.


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