Haifa, Israel

Einat Peled


Average Co-Inventor Count = 4.5

ph-index = 1

Forward Citations = 1(Granted Patents)


Location History:

  • Pardes Hanna-Karkur, IL (2023)
  • Haifa, IL (2019 - 2024)

Company Filing History:


Years Active: 2019-2024

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5 patents (USPTO):Explore Patents

Title: Einat Peled: Innovator in Overlay Metrology and Quantum Computing

Introduction

Einat Peled is a prominent inventor based in Haifa, Israel, known for her significant contributions to the fields of overlay metrology and quantum computing. With a total of five patents to her name, she has made remarkable advancements that enhance the accuracy and efficiency of semiconductor manufacturing processes.

Latest Patents

One of her latest patents focuses on reference image grouping in overlay metrology. This innovative overlay metrology system includes a controller that receives metrology data associated with multiple overlay targets on one or more samples. It generates a reference metric for these targets based on the metrology data, classifies them into groups, and generates corrected metrology data to improve overlay measurements.

Another notable patent involves fab management with dynamic sampling plans, optimized wafer measurement paths, and optimized wafer transport using quantum computing. This system optimizes wafer transport and metrology measurements in a fabrication facility by deriving dynamic sampling plans and managing the transport of wafers to measurement tools. Quantum computing resources are utilized to solve optimization problems, enhancing the yield and accuracy of produced wafers.

Career Highlights

Einat has worked with notable companies such as Kla Tencor Corporation and Kla Corporation, where she has applied her expertise in metrology and quantum computing. Her work has significantly impacted the semiconductor industry, leading to improved manufacturing processes and product quality.

Collaborations

Throughout her career, Einat has collaborated with talented individuals, including Eran Amit and Yuval Lamhot. These collaborations have fostered innovation and contributed to the advancement of technology in her field.

Conclusion

Einat Peled is a trailblazer in the realm of overlay metrology and quantum computing. Her innovative patents and contributions to the semiconductor industry highlight her role as a leading inventor. Her work continues to influence the future of technology and manufacturing processes.

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