Dwayne M Burek

Title: Innovations by Dwayne M. Burek: A Focus on Memory Testing Technologies

Introduction: Dwayne M. Burek, based in San Jose, California, is an accomplished inventor recognized for his contributions to the field of electronics and memory testing technologies. With a total of six patents to his name, Burek has made significant advancements that enhance the functionality and reliability of electronic devices.

Latest Patents: Among his most recent patents, Burek has developed technologies such as the "Asynchronous Control of Memory Self Test." This innovative approach integrates a memory logic built-in self-test (BIST) that leverages slow speed controller-to-collar signals, allowing collars to perform memory tests at full speed. The controller within this system is designed to manage features such as control, addressing, data handling, and redundancy evaluations while facilitating scheduling and diagnostics interfacing. Notably, the collars can execute BIST testing in various configurations—serially, in parallel, or in groups—while transmitting diagnostic results back to the controller for centralized analysis.

Another recent patent is the "Method and Program Product for Designing Hierarchical Circuit for Quiescent Current Testing." This method outlines a circuit design involving hierarchical blocks that necessitate block-specific test patterns for effective quiescent current testing. The process includes configuring the block and its embedded components in test modes, generating appropriate test patterns, and ensuring synchrony between the test patterns across embedded blocks. This careful design minimizes elevated quiescent current levels and enhances testing efficiency.

Career Highlights: Throughout his career, Burek has worked at notable companies, including LogicVision, Inc. and Northern Telecom Limited. His experiences at these organizations have contributed to his expertise in developing cutting-edge technologies that address critical needs in memory testing and circuit design.

Collaborations: Burek has collaborated with talented professionals such as Benoit Nadeau-Dostie and Fadi Maamari. These partnerships have fostered innovative ideas and provided a collaborative environment that enhances the development of their projects.

Conclusion: Dwayne M. Burek exemplifies the spirit of innovation through his impactful patents that focus on memory testing systems. His contributions not only advance the field of electronics but also pave the way for future developments in efficient and reliable circuit design. As he continues to explore new frontiers, Burek’s work remains a testament to the importance of innovation in technology.