Company Filing History:
Years Active: 2021-2024
Title: Dugan C Yoon: Innovator in Optical Characterization and Imaging Technologies
Introduction
Dugan C Yoon is a notable inventor based in Honolulu, HI (US), recognized for his contributions to optical characterization and imaging technologies. With a total of three patents to his name, Yoon has made significant advancements in the field of remote optical characterization and underwater imaging systems.
Latest Patents
One of Yoon's latest patents is titled "System and method of utilizing polarized light for remote optical characterization of and through scattering media." This innovative system characterizes the optical properties of light-transmitting media by determining the scattering rate of light through a medium using polarized light. The method enables functions such as detecting objects embedded in the medium, object ranging, and deblurring images acquired through the medium.
Another significant patent is the "System and method for generating three-dimensional imagery." This underwater imaging system is designed to be carried by a submersible platform, capturing images that are processed into three-dimensional representations. The system utilizes a high-speed image sensor to capture sequential gated images, which are synchronized with laser beam pulses to create a 3D dimensional video transmitted to a control unit above the water's surface.
Career Highlights
Dugan C Yoon is currently employed at BAE Systems Information and Electronic Systems Integration Inc., where he continues to develop innovative technologies. His work has contributed to advancements in optical systems and imaging techniques, showcasing his expertise in the field.
Collaborations
Yoon has collaborated with notable colleagues, including Michael J DeWeert and Reid A Noguchi, who have also contributed to the development of advanced technologies in their respective fields.
Conclusion
Dugan C Yoon's innovative work in optical characterization and imaging technologies has positioned him as a significant figure in the field. His patents reflect a commitment to advancing technology and improving methods for optical analysis and imaging.