The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
May. 28, 2020
Applicant:
Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Inventors:
Michael J. DeWeert, Kaneohe, HI (US);
Eric M. Louchard, Miami, FL (US);
Reid A. Noguchi, Honolulu, HI (US);
Dugan C. Yoon, Honolulu, HI (US);
Assignee:
BAE Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 11/16 (2006.01); G01J 4/04 (2006.01); G01S 7/499 (2006.01); G01S 17/18 (2020.01); G01N 21/21 (2006.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 11/168 (2013.01); G01J 4/04 (2013.01); G01N 21/21 (2013.01); G01S 7/499 (2013.01); G01S 17/18 (2020.01); G01S 17/89 (2013.01);
Abstract
Systems and methods for three-dimensional (3D) shape estimation of objects embedded in light-scattering media via polarimetry are provided. The systems and methods utilize polarization to exploit forward scattering in the light-scattering medium to mitigate backscatter interference (BSI).