The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Apr. 29, 2022
Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Michael J. DeWeert, Kaneohe, HI (US);
Eric M. Louchard, Miami, FL (US);
Reid A. Noguchi, Honolulu, HI (US);
Gary Sawai, Wahiawa, HI (US);
Dugan C. Yoon, Honolulu, HI (US);
BAE Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Abstract
A system and method is provided to characterize optical properties (Scattering, attenuation, de-polarization) of a light-transmitting medium and local environment, by determining a scattering rate of light through a medium, wherein determining the scattering rate of light through the medium is accomplished by utilizing polarized light transmitted from an optical source. The system and method performs a function based on the characterized optical properties of the medium, wherein the function is one of, for example: detection of objects embedded in the medium, object ranging through the medium, or deblurring of images acquired through the medium.