This inventor holds 4 USPTO granted patents and 1 EPO patent. Top assignees: Kla Tencor Corporation, Kla-Tencor Technologies Corporation, Societe De Production Et De Recherches Appliquees. Active years: 1997-2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Vannes, FR (1999)
- Vanves, FR (1997 - 2004)
Company Filing History:
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Years Active: 1997-2004
Title: Dorian Zahorski: Innovator in Spectroscopic Technology
Introduction
Dorian Zahorski is an accomplished inventor based in Vanves, France, recognized for his contributions to the field of optical technologies. With a total of four patents to his name, Zahorski has made significant advancements, particularly in spectroscopic methods that enhance measurement capabilities in various scientific applications.
Latest Patents
One of Zahorski's latest innovations is the "Focused Beam Spectroscopic Ellipsometry Method and System". This sophisticated method employs reflective optics to measure a small region of a sample by reflecting broadband ultraviolet, visible, and near-infrared radiation from the sample area. The system features an autofocus assembly and a processor tailored to determine the thickness and complex refractive index of thin films on samples. By utilizing only reflective optics along the optical path, his design minimizes off-axis aberrations through an elliptical focusing mirror. The integrated instrument can also combine a spectrophotometer and an ellipsometer, sharing radiation sources to collect data from the same focal point.
Career Highlights
Throughout his career, Dorian Zahorski has worked with prominent companies, including Tencor Instruments and Kla-Tencor Technologies Corporation. His role at these organizations has not only contributed to advancing technology but also provided him with a platform to introduce his innovative ideas.
Collaborations
Zahorski has collaborated with several esteemed professionals, including Jean-Louis Stehle and Timothy R. Piwonka-Corle. These collaborations have been instrumental in refining his technological advancements and pushing the boundaries of optical measurement systems.
Conclusion
Dorian Zahorski's work exemplifies the essence of innovation in the field of optics. His latest patents reflect a deep understanding of spectroscopic ellipsometry, showcasing his ability to meld scientific inquiry with advanced engineering. As he continues to develop new technologies, Zahorski stands as a notable figure in the ever-evolving landscape of optical innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile