Jena, Germany

Dominik Stehr

USPTO Granted Patents = 5 

 

Average Co-Inventor Count = 4.4

ph-index = 2

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 2017-2022

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5 patents (USPTO):Explore Patents

Title: Dominik Stehr: Innovator in Microscopy

Introduction

Dominik Stehr is a prominent inventor based in Jena, Germany. He has made significant contributions to the field of microscopy, holding a total of 5 patents. His innovative work focuses on enhancing the methods and devices used for viewing specimens.

Latest Patents

One of his latest patents is a microscope and method for viewing a specimen using a microscope. This invention relates to a method that includes an objective lens and an image sensor for converting an image formed on the image sensor by the objective lens. The field of view of the microscope can be varied by selecting a section of the image sensor. The method involves capturing an initial image of at least a partial section of the specimen and analyzing it to determine differing fields of view. Images of the partial areas of the specimen are captured for each determined field of view. Another notable patent is a measuring device for examining a specimen and a method for determining a topographic map of a specimen. This method includes receiving height measurement data and an overview image of the sample, identifying certain image regions, and deriving context information to supplement or alter the height measurement data.

Career Highlights

Dominik has worked with notable companies in the field, including Carl Zeiss Microscopy GmbH and SD Optics, Inc. His experience in these organizations has contributed to his expertise in microscopy and innovation.

Collaborations

Throughout his career, Dominik has collaborated with talented individuals such as Alexander Gaiduk and Wolf Jockusch. These collaborations have likely enriched his work and led to further advancements in his inventions.

Conclusion

Dominik Stehr is a dedicated inventor whose work in microscopy has led to several important patents. His innovative methods and devices continue to influence the field and enhance the way specimens are viewed and analyzed.

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