Carl Zeiss Microscopy Gmbh

Stereo Display, Inc.

Sd Optics, Inc.

Dominik Stehr

Alexander Gaiduk

Johannes Winterot

Benno Radt

Peter Weber

Wolf Jockusch

Daniel Haase

Manuel Amthor

Jin Young Sohn

Johannes Knoblich

Thomas Milde

Hans Tandler

Jan Buchheister

Max Funck

Cheong Soo Seo

Gyoungil Cho

Robert Schrem

Markus Gnauck

Enrico Geißler

Volker Pusch

Robert Zarnetta

Viktor Drescher

The present invention relates to a method for viewing a specimen using a microscope which comprises an objective lens and an image sensor for converting an image formed on the image sensor by the objective lens. A field of view of the microscope can be varied by selecting a section of the image sensor. In one step of the method, an initial image of at least a partial section of the specimen is captured with the microscope, for which a first field of view is selected on the microscope. The initial image is analyzed to determine at least two differing fields of view forming a partial area image, wherein a partial area of the initial image is formed by each of the fields of view forming a partial area image. Images of the partial areas of the specimen are captured for each of the determined fields of view forming a partial area image. The invention further relates to a microscope for viewing a specimen using a microscope.

Microscope and method for viewing a specimen using a microscope

A method for determining a height map of a sample includes the following steps: receiving height measurement data of the sample; receiving an overview image of the sample; identifying certain image regions in the overview image; deriving context information in relation to identified image regions; and supplementing or altering the height measurement data with the aid of the context information. Moreover, a measuring apparatus configured to carry out the method is described.

Measuring device for examining a specimen and method for determining a topographic map of a specimen

An adapter is suitable for adapting a microscope objective to an electronic interface of a digital microscope. A method includes measuring and storing optical properties of the microscope objective; measuring a storing mechanical properties of the microscope objective; and providing the stored optical and mechanical properties to the electronic interface as optical and mechanical data. The adapter includes a mechanical interface having an adjuster for adjusting the optical components of the standard objective, a digital memory, an electronic interface and at least one electronic component for providing the data of the digital memory to the electronic interface.

Method and adapter for adapting a microscope objective to a digital microscope

The invention relates to a control device and to a method for controlling a motorized digital microscope. The control device comprises at least one first module () for controlling the hardware, the software and the work flow of the digital microscope during the examination of a specimen. According to the invention, the first module () comprises a first input means () having force feedback for controlling functions of the digital microscope. In a method according to the invention, data input takes place via a first input means, wherein force feedback is generated via the success or progression of the input.

Force-feedback control device and method for digital microscope

Combined touchpad, operating knobs and display module for electrical control device

Growing community of inventors

Jena, Germany

Dominik Stehr